100年第2學期-0747 材料：材料分析 課程資訊

評分方式

評分項目	配分比例	說明
Attendance	5
Term Paper	15
Presentation	30
Final	50

教育目標

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.

課程概述

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.

基本資料

選修課，學分數：0-3
上課時間：二/3,4[C219] 五/3[CME102]
修課班級：化材系3,4
修課年級：年級以上
選課備註：

參考書目

Textbook:
D.J. O’Connor, B.A. Sexton, and R.St.C. Smart edited, Surface Analysis Methods in Materials Science, Springer, 1992.

References:
1. P.G. Merli and M.V. Antisari edited, Electron Microscopy in Materials Science, World Scientific, 1992.
2. B.D. Cullity, Elements of X-ray Diffraction, 2nd Edition, Addison-Wesley, 1978.
3. 吳泰伯等, 材料分析儀器, 精密儀器發展中心, 1998.
4. 汪建民編, 材料分析, 中國材料科學學會, 1998.