100年第2學期-1001 超大型積體電路測試 課程資訊

評分方式

評分項目 配分比例 說明
隨堂作業 40
期中考筆試 30
期末考筆試 30

選課分析

本課程名額為 70人,已有12 人選讀,尚餘名額58人。


登入後可進行最愛課程追蹤 [按此登入]。

授課教師

黃宇中

教育目標

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.

課程概述

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.

課程資訊

參考書目

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, M. Bushnell and V. Agrawal, Kluwer Academic Publishers, 2000. and Lecture Notes

開課紀錄

您可查詢過去本課程開課紀錄。 超大型積體電路測試歷史開課紀錄查詢