105年第2學期-0908 材料：材料分析 課程資訊

評分方式

評分項目	配分比例	說明
Attendance	5
Presentation	30
Term Paper	15
Exam	50

教育目標

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes. 1. Structure of Material Surfaces 2. Low Energy Electron Diffraction 3. X-ray Photoelectron Spectroscopy 4. Auger Electron Spectroscopy 5. Low Energy Ion Scattering 6. Secondary Ion Mass Spectroscopy 7. Vibrational Spectroscopy 8. Scanning Probe Microscopy 9. Thermal Analysis 10. Chromatography 11. Electron Microscopy 12. X-ray Diffraction

課程概述

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.

基本資料

選修課，學分數：0-3
上課時間：五/3[A103] 二/3,4[CME102]
修課班級：化材系3,4
修課年級：年級以上
選課備註：

參考書目

Textbook:
J. C. Vickerman and I. S. Gilmore, Surface Analysis-The Principal Techniques, 2nd edition, John Wiley & Sons, 2009.

References:
1. D.J. O’Connor, B.A. Sexton, and R.St.C. Smart edited, Surface Analysis Methods in Materials Science, Springer, 1992.
2. P.G. Merli and M.V. Antisari edited, Electron Microscopy in Materials Science, World Scientific, 1992.
3. B.D. Cullity, Elements of X-ray Diffraction, 2nd Edition, Addison-Wesley, 1978.
4. 吳泰伯等, 材料分析儀器, 精密儀器發展中心, 1998.
5. 汪建民編, 材料分析, 中國材料科學學會, 1998.