109年第2學期-0815 材料:材料分析 課程資訊
評分方式
評分項目 | 配分比例 | 說明 |
---|---|---|
Attendance | 5 | |
Presentation | 30 | |
Term Paper | 15 | |
Exam | 50 |
選課分析
本課程名額為 50人,已有51 人選讀,尚餘名額-1人。
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教育目標
The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
1. Structure of Material Surfaces
2. Low Energy Electron Diffraction
3. X-ray Photoelectron Spectroscopy
4. Auger Electron Spectroscopy
5. Low Energy Ion Scattering
6. Secondary Ion Mass Spectroscopy
7. Vibrational Spectroscopy
8. Scanning Probe Microscopy
9. Thermal Analysis
10. Chromatography
11. Electron Microscopy
12. X-ray Diffraction
課程概述
The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
課程資訊
基本資料
選修課,學分數:0-3
上課時間:二/3,4[A105] 五/4[A106]
修課班級:化材系3,4
修課年級:年級以上
選課備註:
教師與教學助理
授課教師:何志松
大班TA或教學助理:尚無資料
Office HourTime: Anytime if available or by appointment
Place: CME 211
授課大綱
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參考書目
Textbook:
J. C. Vickerman and I. S. Gilmore, Surface Analysis-The Principal Techniques, 2nd edition, John Wiley & Sons, 2009.
References:
1. D.J. O’Connor, B.A. Sexton, and R.St.C. Smart edited, Surface Analysis Methods in Materials Science, Springer, 1992.
2. P.G. Merli and M.V. Antisari edited, Electron Microscopy in Materials Science, World Scientific, 1992.
3. B.D. Cullity, Elements of X-ray Diffraction, 2nd Edition, Addison-Wesley, 1978.
4. 吳泰伯等, 材料分析儀器, 精密儀器發展中心, 1998.
5. 汪建民編, 材料分析, 中國材料科學學會, 1998.
開課紀錄
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