98年第2學期-1001 超大型積體電路測試 課程資訊

評分方式

評分項目	配分比例	說明
隨堂作業	40
期中考筆試	30
期末考筆試	30

教育目標

Course will contain topics related to VLSI testing, including logic simulation, fault modeling, fault simulation, boundary scan, memory test etc.

課程概述

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.

基本資料

選修課，學分數：0-3
上課時間：二/3,4[MⅠ003] 三/2[MⅠ101]
修課班級：電機系3
修課年級：年級以上
選課備註：

參考書目

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, M. Bushnell and V. Agrawal, Kluwer Academic Publishers, 2000. and Lecture Notes